Expert Directory
Having an expert witness or consultant at your side can help you navigate complex situations with confidence. These professionals understand your industry and excel at conveying crucial information, whether in a courtroom or a consulting environment. At Intellex, we have experts in over 30,000 areas in our database. We enable you to partner with an individual who has the knowledge, educational background, and relevant experience to support your needs effectively.
Utilize our expert finder tool to handpick the ideal mentor or consultant for your specific application.
Root Cause Analysis, Problem Solving, SPC, Design of Experiments, Six Sigma
Expert has been a member of ASQ for 20 years. He has been a senior member of ASQ for 10 years. He has served as the Examining Chair for the Indianapolis Section of ASQ for 15 years. Through his work…
Oil and Gas Prospect and Property Evaluation, Geologic and Reservoir Modeling, Oilfield Equipment
Expert has experience with Survey Design: gravity, magnetic, surface geochem, remote sensing, and seismic. Expert can do direct hydrocarbon indicator analysis of seismic data. Expert also has experience with Time depth analysis, calibration and conversion, Seismic forward modeling, Seismic inversion,…
Protection Design, Testing, Data Analyses, EMP, EMC, COMSEC, ZONING, TEMPEST
The electromagnetic protection process is an evaluation of risk assessment against criteria (EMP, EMI/EMC, TEMPEST, EM-health). The entire process covers mainly: risk evaluation, design, construction, maintenance and testing. Starting from the risk evaluation, the different aspects of electromagnetic protection can…
Explosives Instrument Detection, Trace Explosives Chemical Analysis, Optical Spectroscopy, Polymers
Expert has spent over 15 years working in the field of analytical chemistry of various labile organic compounds and macromolecules. He worked on the quantitative and qualitative analysis of highly involatile species that required special sample preparation and processing. These…
ISO 9001-2000/TS 16949 audits, documentation, training, assistance for certification, APQP, SPC
Expert is an ISO 9000 Lead auditor. He has been implementing developed by ISO like ISO 9000, ISO 13485, and ISO 17025 for many years. He has assisted several companies from various industries to become certified from scratch. He has…
Advanced Semiconductor Lithography
Expert has worked in electron beam lithography research and application since graduate school. Specifically he developed new pattern generation techniques for improved throughput and accuracy. He also developed a new generation of electron beam mask writer. His work on the…
Electronic and Mechanical Design of Consumer and Healthcare Products for Asian Manufacture
Expert has a biomedical engineering degree from MIT (option of electrical engineering). He was instrumental in the development of an acoustic-based diagnostic instrument for the detection of otitis media (fluid in the ear due to ear infection). The product was…
AOI Industrial Inspection: Processes, Feasibility, Optimization; AOI Equipment: Design / Upgrades
Expert founded a consulting company specializing in supporting the manufacturing industry, which uses AOI, automated optical inspection or measurement systems in their production processes. Her emphasis is on practical support for the manufacturing engineers given a tough task of selecting,…
Geometric Dimensioning & Tolerancing, Design for Manufacturability, Tolerancing Optimization, etc.
Expert has over 30 years experience in the aerospace, defense and commercial industries with extensive expertise in the mechanical and precision engineering fields as an engineer, manager, consultant, educator and author with tremendous emphasis on geometric tolerancing. He is a…
Thin Film Solar Cell Testing; Semiconductor Optoelectronic Device Measurement and Analysis
Expert has been involved in research and development of amorphous silicon (a-Si) thin film solar cells for 20 years; in this time he has authored or co-authored over 30 papers. He has guided the optimization of device performance from three…