Expert Details
Electronics Design and Manufacture Reliability, Failure Analysis, Asia Manufacturer Risk Management
ID: 727301
Washington, USA
Expert has extensive reliability experience with consumer, computer, communication, medical and electronics components manufacturers in US, Europe and Asia. He is bilingual and is fluent in Chinese. Additionally, he holds over 30 patents in the areas of optics, computer inputs and printing, etc.
Array
Consulted for Asian components and system manufactureres (e.g., opto-electronics, assembly ESD program, PFMEA)
Consulted for Medical and telecom businesses in addition to consumer/computer and communication industries (e.g., root cause analysis, new technology reliability assessments)
Education
Year | Degree | Subject | Institution |
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Year: 1991 | Degree: PhD | Subject: Physics | Institution: CUNY |
Year: 1986 | Degree: BS | Subject: EE | Institution: Tsinghua University |
Work History
Years | Employer | Title | Department |
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Years: 1998 to 2009 | Employer: Microsoft | Title: Principal Engineering Manager | Department: |
Responsibilities:Available upon request. |
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Years | Employer | Title | Department |
Years: to Present | Employer: Undisclosed | Title: Reliability Physicist | Department: |
Responsibilities:Available upon request. |
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Years | Employer | Title | Department |
Years: 2009 to 2011 | Employer: DfR Solutions | Title: Director and Sr. Member of Technical Satff | Department: |
Responsibilities:Reliability consulting and training for international clients. Business developments for US west coast and Asia |
Government Experience
Years | Agency | Role | Description |
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Years: 1987 to 1993 | Agency: Brookhaven National Lab | Role: Researcher | Description: |
International Experience
Years | Country / Region | Summary |
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Years: 1995 to Present | Country / Region: China, Taiwan, Hong Kong, Japan, SIngapore | Summary: |
Years: 1998 to Present | Country / Region: Germany, France, Malta, Denmark | Summary: |
Years: 1991 to Present | Country / Region: USA | Summary: |
Career Accomplishments
Associations / Societies |
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IEEE, SMTA, IPC |
Awards / Recognition |
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CEO Quality Award |
Publications and Patents Summary |
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He currently has 16 refereed publications in professional journals and book chapters and over 30 issued US patents |
Additional Experience
Training / Seminars |
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Design for reliability FMEA Reliability assessments Opto-electronics reliability Establishing Effective Reliability Programs |
Vendor Selection |
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Extensive experience in Tier 1/Tier 2/Tier 3 supplier assessment, selection, development and quality/reliability risk management across US, Europe and Asia with heavy focus in Asia. Native speaker of Chinese. |
Marketing Experience |
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Direct experience in consumer/computer hardware, medical and telecommunication industry including and consulting experience in aerospace, energy, industrial equipment industries. |
Other Relevant Experience |
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Holder of over 30 US patents in the area of new IT device and applications |
Language Skills
Language | Proficiency |
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Chinese | Native |
Fields of Expertise
computer system reliability improvement, electrical product reliability improvement, electronic device quality assurance, electronic device reliability, electronic-device-component life-prediction methodology, electronics reliability testing, electrostatic discharge prevention, environmental-stress screening, failure modes and effects analysis, failure rate, product reliability, product reliability improvement, product reliability plan, quality reliability, quality reliability plan, reliability, reliability analysis, reliability engineering, reliability improvement, reliability plan, reliability prediction, reliability test, reliability testing, reliability theory, semiconductor device reliability, system reliability, accelerated aging, engineering quality assurance, forensic materials failure analysis, medical device hazard analysis, medical device manufacturing troubleshooting, medical device reliability testing, medical device safety, medical device shelf life, quality auditing, quality engineering, quality improvement, supplier quality assurance, supplier quality engineering, supplier quality improvement, supplier risk assessment, evidence, eyewitness reliability, silicon component reliability, bipolar transistor beta (Hfe) degradation, electrical laboratory, casing reliability, automobile reliability testing, printed circuit board reliability, surface-mount assembly reliability, failure distribution, electrical leakage, integrated-circuit reliability, computer reliability prediction, accelerated solder joint testing, case temperature, battery degradation, electrical contact material, electrical connector reliability, semiconductor device package reliability, acceptance test, acceptable quality level, equipment maintenance, battery reliability, bearing reliability, capacitor testing, plastic encapsulated microcircuit reliability, printed-wiring board reliability, electrical connector corrosion, crystal environmental-stress screening, crystal reliability, electronic assembled device reliability, ceramic material reliability improvement, solid electrolyte tantalum capacitor reliability improvement, solid electrolyte tantalum capacitor reliability, ceramic capacitor reliability improvement, capacitor reliability improvement, mechanical product reliability improvement, microelectronic device reliability improvement, microcomputer system reliability improvement, minicomputer system reliability improvement, electronic device reliability improvement, transistor reliability, electric conductor failure, mechanical reliability, electrical product research and development, capacitor reliability, ceramic capacitor reliability, telecommunication system electrical reliability, computer system electrical reliability, electronic component defect, creep-induced solder joint failure, electronic circuit element testing, surface-mount solder joint reliability, solder joint reliability, electronic component processing, electrical product development, electronic-component environmental protection, equipment failure analysis, fault tree analysis, electromigration, design engineering, computer system, electronic assembled device, electronic device, crystal defect, electronics testing, electrical connector, derating, computer data storage, ceramic capacitor, capacitor