Expert Details
Thin-Film Deposition, Lasers, Optical Spectroscopy, Cryogenics
ID: 729232
Ohio, USA
Introducing and adapting specific optical quality measurements for Nissin Brake OH. At WPAFB, he successfully implemented lock–in technique in a Bomem Fourier spectrometer in order to measure far infrared emission without the influence of black body radiation.
Education
| Year | Degree | Subject | Institution |
|---|---|---|---|
| Year: 1988 | Degree: PhD | Subject: Physics | Institution: University of Vienna |
| Year: 1986 | Degree: MBA | Subject: Physics | Institution: University of Vienna |
| Year: 1981 | Degree: BS | Subject: Electrotechnique/Electronics | Institution: Polytechnic St. Poelten (Austria) |
Work History
| Years | Employer | Title | Department |
|---|---|---|---|
| Years: 2004 to Present | Employer: Undisclosed | Title: Research Physicist | Department: Air Force Research Laboratory (AFRL/RXPS) |
Responsibilities:Available upon request. |
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| Years | Employer | Title | Department |
| Years: 2000 to 2010 | Employer: Bowling Green State University | Title: Assist./Assoc. Prof. | Department: Physics and Astronomy |
Responsibilities:Available upon request. |
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| Years | Employer | Title | Department |
| Years: 1998 to 2000 | Employer: Institute of Physical and Chemical Research (RIKEN), Japan | Title: Frontier Researcher | Department: |
Responsibilities:Available upon request. |
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| Years | Employer | Title | Department |
| Years: 1993 to 1998 | Employer: New Energy and Industrial Technology Development Organization (NEDO), Japan | Title: Industrial Researcher | Department: |
Responsibilities:Available upon request. |
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| Years | Employer | Title | Department |
| Years: 1991 to 1993 | Employer: Technical University Graz, Austria | Title: Lecturer | Department: |
Responsibilities:Available upon request. |
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| Years | Employer | Title | Department |
| Years: 1989 to 1991 | Employer: University of Strasbourg, France | Title: Postdoctoral Researcher | Department: |
Responsibilities:Available upon request. |
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Career Accomplishments
| Associations / Societies |
|---|
| Member of the Optical Society of America (OSA), International Society for Optical Engineering (SPIE), and the Institute of Physics (IOP). |
| Awards / Recognition |
|---|
| Honorably listed in: - Marquis Who’s Who (13th Edition) - Marquis Who’s Who in Science and Engineering (4th Edition), - Five Hundred Leaders of Influence of The American Biographical Institute (6th Edition) - 2000 Outstanding People of the 20th Century of the International Biographical Centre Cambridge, England - Man of Achievement, Seventeenth Edition 1997, International Biographical Centre Cambridge, England Awards - The 1996 - Man of The Year - Commemorative Medal from The American Biographical Institute due to outstanding publication record. |
| Publications and Patents Summary |
|---|
| He has more than 150 publications and 5 patents. |
Fields of Expertise
semiconductor growth, thin-film analysis, thin-film circuit element, thin-film coating process, thin-film deposition, vacuum technology, absorption spectroscopy, absorption spectrum, applied spectroscopy, Fabry-Perot interferometer, Fourier transform, gallium arsenide laser, gas laser, helium-neon laser, laser ablation, laser development, laser safety regulation, optical spectroscopy, semiconductor laser, solid-state laser, Bragg angle, Bragg's law, cryogenics, geometrical optics, high-temperature superconductivity, high-temperature superconductor, laser optics, solid-state physics, thin-film optics, nanomaterial, nanoparticle, amorphous photovoltaic cell, amorphous semiconductor, amorphous solid, disordered material, doped semiconductor, electronics, energy band, exciton, II-VI semiconductor material, III-V semiconductor material, indium antimony, intrinsic semiconductor, metal-insulator semiconductor material, metal-oxide semiconductor material, metal-oxide-metal semiconductor material, negative-type semiconductor material, photoconductive effect, photoconductive material, positive-type semiconductor material, semiconductor material, semiconductor material characterization, semiconductor material manufacturing, semiconductor material processing, semiconductor material property, semiconductor rectifier, thin film, Bistability, pulsed laser deposition, fiber laser, Czochralski process, crystal lattice physics, hybrid electronic equipment, semiconductor wafer epitaxial deposition, hybrid microelectronic device, polycrystalline silicon, glass optical fiber, Bardeen-Cooper-Schrieffer theory, cadmium telluride, optical filter design, nanotechnology, advanced material, organic semiconductor material, thin-film application, defect electronics science, optical device, gallium arsenide semiconductor, surface effect, Zener breakdown, semiconductor wafer, ultraviolet spectroscopy, semiconductor processing equipment, optical thin film, non-linear optics, hybrid integrated circuit, excimer laser, crystalline structure