Expert Details
X-ray Diffraction, Microscopy, Spectroscopy and Imaging
ID: 731791
California, USA
Specialties: X-ray Diffraction, Small angle x-ray scattering, Pair distribution function analysis, reflectivity and epitaxy, Spectroscopy (FTIR, Fluoroscence, Raman, EXAFS and XANES, SEM, Micro computer Tomography, Thermal gravimetry (TGA), chemical analysis and transport properties.
Material characterization at non-ambient conditions - interplanetary interior (ultra high-pressure, ultra high-temperature using resistive and infrared laser heating and ultra low temperature up to liquid helium
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Education
| Year | Degree | Subject | Institution |
|---|---|---|---|
| Year: 2005 | Degree: Postdoctoral | Subject: Mineralogy | Institution: MIT |
| Year: 2003 | Degree: Postdoctoral | Subject: Physics | Institution: Harvard |
Work History
| Years | Employer | Title | Department |
|---|---|---|---|
| Years: 2008 to 2013 | Employer: PANalytical | Title: Senior scientist | Department: |
Responsibilities:Available upon request. |
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Fields of Expertise
austinite, crystallography, extended X-ray absorption fine structure, epitaxy, material analysis, stress analysis, crystalline structure, powder X-ray diffraction, diffractometer, thin-film analysis, crystal structure determination, angle of incidence, coating material analysis, cubic crystal, diffraction, diffraction pattern, metal internal stress, metal nondestructive testing, microcrystalline, nondestructive testing, particle surface area determination, powder pattern, stress corrosion, stress measurement, unit cell, X-ray absorption spectroscopy, X-ray crystallography, X-ray diffraction, X-ray measurement, X-ray diffraction analysis, X-ray equipment