Intellex Acquires Expert by Big Village

We're thrilled to announce that Intellex has acquired Expert by Big Village, effective March 22, 2024. This strategic move enhances our capabilities and strengthens our commitment to delivering exceptional solutions to our customers.

Stay tuned for more updates on how this acquisition will benefit our clients and experts.

For inquiries or more information, please contact us at info@intellex.com.

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Expert Details

X-ray Diffraction, Microscopy, Spectroscopy and Imaging

ID: 731791 California, USA

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Experienced in synthesis and characterization of superconducting oxides, doped metal oxides, minerals, metals, nanocrytsalline materials, single crystals, polycrystalline and epitaxial films.

Specialties: X-ray Diffraction, Small angle x-ray scattering, Pair distribution function analysis, reflectivity and epitaxy, Spectroscopy (FTIR, Fluoroscence, Raman, EXAFS and XANES, SEM, Micro computer Tomography, Thermal gravimetry (TGA), chemical analysis and transport properties.

Material characterization at non-ambient conditions - interplanetary interior (ultra high-pressure, ultra high-temperature using resistive and infrared laser heating and ultra low temperature up to liquid helium

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Education

Year Degree Subject Institution
Year: 2005 Degree: Postdoctoral Subject: Mineralogy Institution: MIT
Year: 2003 Degree: Postdoctoral Subject: Physics Institution: Harvard

Work History

Years Employer Title Department
Years: 2008 to 2013 Employer: PANalytical Title: Senior scientist Department:
Responsibilities:
Available upon request.

Fields of Expertise

austinite, crystallography, extended X-ray absorption fine structure, epitaxy, material analysis, stress analysis, crystalline structure, powder X-ray diffraction, diffractometer, thin-film analysis, crystal structure determination, angle of incidence, coating material analysis, cubic crystal, diffraction, diffraction pattern, metal internal stress, metal nondestructive testing, microcrystalline, nondestructive testing, particle surface area determination, powder pattern, stress corrosion, stress measurement, unit cell, X-ray absorption spectroscopy, X-ray crystallography, X-ray diffraction, X-ray measurement, X-ray diffraction analysis, X-ray equipment

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Dev Tool:
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