Request Expert

Expert has momentous years of experience in the assessment of space electronics systems to single event effects (SEE) and nuclear transient radiation effects. This includes single event upset, latchup and gate rupture. He also has an extensive history working in the effect of neutrons on avionics, with test and analysis experience alongside.

IR&D Experience:
- Lead IR&D effort at Boeing’s Radiation Survivability.
- Reviewed and assessed IR&D proposals.
- Performed several IR& D efforts and developed a transient suppressor device.

System Engineering Experience:
Through out his career, as a technical performer and technical manager, he has developed engineering processes at Boeing Satellite Development Center, El Segundo, CA. Developed system and component level radiation design requirements, and performed and managed technical tasks. Expert interacted with product reliability, thermal, electronic design, structure, and system engineers.

He managed some US Department of Defense (DOD) program’s tasks based on earn value concept using Microsoft Project software.
At TRW (now Northrop Grumman), he completed internal company training programs in project management with excellence. At Pepperdine University, Expert completed human resource management, statistical methods in research, and organizational behavior courses.

Expert has extensive background knowledge, experience and developed expertise in all aspects of radiation effects on the component and system levels. On the component level, he has expertise at all levels of complexities of integrated circuits in terms of technology (CMOS, Bipolar, HBT) down to submicron devices < 0.1 um, and frequency up to a 16 GHz in performance, in materials: Si. SiGe, GaAs, InP, and transition metal oxides.

His experience covers the effects of the natural space (single event upset, latchup, gate rupture and burnout due to cosmic rays and electrostatic discharge), and nuclear radiation (upset, latchup, and burnout due to system generated electromagnetic pulse (SGEMP), and neutron and gamma rays) on devices and systems ranging from analytical studies of the basic mechanisms to actual participation in testing and hardening the design. He has used a 3D-device simulation code, DAVINCI, to understand and predict device responses to the various radiation effects and to harden SiGe and InP devices to single event upset. As a student, he developed a transient suppressor device. At TRW, he was responsible for the analysis, testing, and evaluation of the radiation hardness of 13 MILSTAR LSI device types of various technologies and complexities (LSI, VLSI, and VHSIC). He also conducted a development phase hardness design of a mobile communication system against HEMP and lightning. On key projects such as DESAS, GWEN, MILSTAR, and GMMC, he performed various tasks involving electromagnetic coupling analysis to antennas, structures, wires and cables and established the threat waveforms to interface circuits.

At Hughes Aircraft company, he discovered single event latchup in CMOS on epi devices and in bipolar emitter coupled logic (ECL) devices and established, as a first article, the theory of single event latchup in CMOS. He published major papers in theory of latchup in CMOS and on the verification of SEU and DEU (double upset) prediction with on-orbit data. He has been responsible for single event assessment of over 75 military and commercial satellites. Earlier, he was responsible for radiation analysis and testing for numerous electronic components and systems on programs such as WGS, ICO, Spaceway, Thuraya, UHF/EHF, MCP, MILSTAR, BSTS, MMB, ESP, AUSSAT, Galaxy, and many others satellites.

At California State University (Long Beach), lectured a course in astronautic and space for three years.

Expert has managed multiple U.S. Department of Defense (DOD) program’s tasks based on earn value concept using Microsoft Project software.