Expert Details

Infrared Imaging

ID: 715225 Florida, USA

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INFRARED IMAGING: THERMAL IMAGING; INFRARED DETECTION SYSTEMS. Expert has worked with infrared imaging systems for the past 15 years. He is fully conversant on all subsystem components including optics, scanners, detectors, coolers, electronics, displays, and human interpretation of image quality. In addition, he is knowledgeable of image processing algorithms that optimize imagery. Expert characterized system performance for scanning, staring, push broom, and machine vision systems and is knowledgeable of state-of-the-art performance models. He created numerous new tests procedures and is familiar with all automated test systems. Expert performed laboratory measurements and compared predicted values to measured values. He can answer in-depth questions regarding all phases of designing, analyzing, testing, and predicting performance.

INFRARED IMAGING SYSTEM APPLICATIONS; NON-DESTRUCTIVE TESTING. Expert is familiar with numerous system applications such as target detection, remote sensing, non-destructive testing, law enforcement, pollution abatement, maintenance, industrial inspection, and medical uses. Expert has developed software that can analyze all imaging systems. He can select the best system for a client's application by taking into account resolution, sensitivity, wavelength (spectral response), atmospheric transmittance, and target characteristics. Expert invented the Standard Correlation Target Set(R) which evaluates the effectiveness of infrared image processing algorithms. He developed new test targets to measure interlace. He has characterized system performance, performed laboratory measurements, and compared predicted values to measured values. Expert developed a new eye model that has become the industry standard and is incorporated in FLIR92. He created numerous new test procedures and recommended an automatic minimum resolvable temperature (MRT) test procedure.

CCD CAMERAS; CCD ARRAYS; MACHINE VISION; IMAGE PROCESSING. Expert is knowledgeable of CCD array operations (interline transfer, progressive scan, frame transfer, time-delay-and-integrate, and line scanners) and a multitude of CCD camera applications. He has developed a software package that creates imagery that has been modified by component MTFs, corrupted by aliasing, and degraded by noise. The user-friendly, flexible software models both visible and infrared imaging systems. Expert can help clients sort through CCD array, CCD camera terminology, and predict camera performance. He will assist clients in selecting the best camera for their application.

ADVANCED TACTICAL AIR RECONNAISSANCE SYSTEM. Expert has analyzed, modeled, and tested the visible and infrared sensors used on the Advanced Tactical Air Reconnaissance System. He recommended new scan patterns that provided better ground coverage and identified image artifacts such as the bow-tie effect and image distortion effects. Expert implemented methods for image zoom without introducing additional image distortion. He related the Image Interpretability Rating Scale to a sensor's signal-to-noise ratio.


Provided consultation to numerous industrial and military agencies. Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Technical expert at design reviewsRecommended test techniques, equipment, and laboratory set up to evaulate visible and infrared systems

Education

Year Degree Subject Institution
Year: 1981 Degree: MEA Subject: Engineering Administration Institution: George Washington University
Year: 1968 Degree: PhD Subject: Physics Institution: University of Connecticut
Year: 1965 Degree: MS Subject: Electrical Engineering Institution: University of Connecticut
Year: 1963 Degree: BSEE Subject: Electrical Engineering Institution: Polytechnic University of New York

Work History

Years Employer Title Department
Years: 1993 to Present Employer: Undisclosed Title: President, Department:
Responsibilities:
Provide consultation to a variety of industries. Plan, organize, and direct the internationally acclaimed SPIE conference Infrared Imaging Systems: Design, Analysis, Modeling and Testing.Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Author of 9 books on imaging systems. Teach short courses.
Years Employer Title Department
Years: 1984 to 1994 Employer: Lockheed Martin Corporation Title: Senior Technical Staff, Department:
Responsibilities:
Principal investigator on numerous visible and infrared systems. Modeled infrared line scanners, push broom, staring and scanning E/O systems.Fully characterized thermal imaging system performance, performed laboratory measurements and compared predicted values to measured values. Recommended and implemented new test procedures.
Years Employer Title Department
Years: 1977 to 1984 Employer: Chemical Research and Development Center, Aberdeen Proving Ground; US Army Title: Chief, Obscuration Sciences Section Department:
Responsibilities:
Available upon request.
Years Employer Title Department
Years: 1968 to 1977 Employer: Frankford Arsenal Title: Principal Investigator, Department:
Responsibilities:
Available upon request.

Career Accomplishments

Associations / Societies
He is a member of IEEE, the Optical Society of America and the International Society for Optical Engineering (SPIE).
Awards / Recognition
Expert was awarded "Outstanding Engineer" and "Engineer of the Year" by the Orlando Chapter of the Institute of Electrical and Electronic Engineers (IEEE).

Fields of Expertise

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