Expert Details
Infrared Imaging
ID: 715225
Florida, USA
INFRARED IMAGING SYSTEM APPLICATIONS; NON-DESTRUCTIVE TESTING. Expert is familiar with numerous system applications such as target detection, remote sensing, non-destructive testing, law enforcement, pollution abatement, maintenance, industrial inspection, and medical uses. Expert has developed software that can analyze all imaging systems. He can select the best system for a client's application by taking into account resolution, sensitivity, wavelength (spectral response), atmospheric transmittance, and target characteristics. Expert invented the Standard Correlation Target Set(R) which evaluates the effectiveness of infrared image processing algorithms. He developed new test targets to measure interlace. He has characterized system performance, performed laboratory measurements, and compared predicted values to measured values. Expert developed a new eye model that has become the industry standard and is incorporated in FLIR92. He created numerous new test procedures and recommended an automatic minimum resolvable temperature (MRT) test procedure.
CCD CAMERAS; CCD ARRAYS; MACHINE VISION; IMAGE PROCESSING. Expert is knowledgeable of CCD array operations (interline transfer, progressive scan, frame transfer, time-delay-and-integrate, and line scanners) and a multitude of CCD camera applications. He has developed a software package that creates imagery that has been modified by component MTFs, corrupted by aliasing, and degraded by noise. The user-friendly, flexible software models both visible and infrared imaging systems. Expert can help clients sort through CCD array, CCD camera terminology, and predict camera performance. He will assist clients in selecting the best camera for their application.
ADVANCED TACTICAL AIR RECONNAISSANCE SYSTEM. Expert has analyzed, modeled, and tested the visible and infrared sensors used on the Advanced Tactical Air Reconnaissance System. He recommended new scan patterns that provided better ground coverage and identified image artifacts such as the bow-tie effect and image distortion effects. Expert implemented methods for image zoom without introducing additional image distortion. He related the Image Interpretability Rating Scale to a sensor's signal-to-noise ratio.
Provided consultation to numerous industrial and military agencies. Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Technical expert at design reviewsRecommended test techniques, equipment, and laboratory set up to evaulate visible and infrared systems
Education
| Year | Degree | Subject | Institution |
|---|---|---|---|
| Year: 1981 | Degree: MEA | Subject: Engineering Administration | Institution: George Washington University |
| Year: 1968 | Degree: PhD | Subject: Physics | Institution: University of Connecticut |
| Year: 1965 | Degree: MS | Subject: Electrical Engineering | Institution: University of Connecticut |
| Year: 1963 | Degree: BSEE | Subject: Electrical Engineering | Institution: Polytechnic University of New York |
Work History
| Years | Employer | Title | Department |
|---|---|---|---|
| Years: 1993 to Present | Employer: Undisclosed | Title: President, | Department: |
Responsibilities:Provide consultation to a variety of industries. Plan, organize, and direct the internationally acclaimed SPIE conference Infrared Imaging Systems: Design, Analysis, Modeling and Testing.Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Author of 9 books on imaging systems. Teach short courses. |
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| Years | Employer | Title | Department |
| Years: 1984 to 1994 | Employer: Lockheed Martin Corporation | Title: Senior Technical Staff, | Department: |
Responsibilities:Principal investigator on numerous visible and infrared systems. Modeled infrared line scanners, push broom, staring and scanning E/O systems.Fully characterized thermal imaging system performance, performed laboratory measurements and compared predicted values to measured values. Recommended and implemented new test procedures. |
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| Years | Employer | Title | Department |
| Years: 1977 to 1984 | Employer: Chemical Research and Development Center, Aberdeen Proving Ground; US Army | Title: Chief, Obscuration Sciences Section | Department: |
Responsibilities:Available upon request. |
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| Years | Employer | Title | Department |
| Years: 1968 to 1977 | Employer: Frankford Arsenal | Title: Principal Investigator, | Department: |
Responsibilities:Available upon request. |
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Career Accomplishments
| Associations / Societies |
|---|
| He is a member of IEEE, the Optical Society of America and the International Society for Optical Engineering (SPIE). |
| Awards / Recognition |
|---|
| Expert was awarded "Outstanding Engineer" and "Engineer of the Year" by the Orlando Chapter of the Institute of Electrical and Electronic Engineers (IEEE). |
Fields of Expertise
Advanced Tactical Air Reconnaissance System, CCD camera, forward-looking infrared imager, image processing, infrared camera, infrared detection system, infrared imaging, infrared imaging application, infrared line scanner, infrared scanner, machine vision, nondestructive testing, thermal imaging, aerial remote sensing, camera testing, detection system, infrared detector technology, optical imaging system, scanning technology, thermal detection, nondestructive test, image processor, aerial reconnaissance, image processing software, image processing hardware, charge-coupled device, infrared detector