Expert Details
Electron Microscopy of Materials
ID: 108060
Pennsylvania, USA
Most of Expert's experience in the analysis of materials has been using X-ray emission spectrometry to determine quantitatively the amounts of elements in small regions of the specimen, in both thin specimens (analytical transmission electron microscopy) and bulk specimens (electron probe X-ray microanalysis).
Expert has 30 years of experience teaching electron optics at college level and has written chapters on this subject for a 2003 textbook on scanning electron microscopy. Knowledge of electron optics is necessary to derive the highest performance from electron microscopes.
Expert has many years of experience in teaching and using SEM for materials research and applications. Current topics of interest are high-resolution SEM using field emission electron guns and quantitative x-ray analysis in the environmental scanning electron microscope (ESEM).
Expert has years of experience in using TEM to solve materials problems. He has taught courses in this area for 30 years, as well. A particular interest of Expert's is in using field emission electron guns to improve the analytical performance of the TEM in measuring small amounts of elements in solids.
My recent consulting has been confined to characterization of materials by electron microscopy, X-ray emission spectrometry, and electron energy loss spectrometry.
Education
| Year | Degree | Subject | Institution |
|---|---|---|---|
| Year: 1974 | Degree: Ph.D. | Subject: Materials Science | Institution: MIT |
| Year: 1968 | Degree: B.S. | Subject: Materials Science and Engineering | Institution: Cornell University |
Work History
| Years | Employer | Title | Department |
|---|---|---|---|
| Years: 1990 to Present | Employer: Undisclosed | Title: Professor of Materials Science & Engineering | Department: |
Responsibilities:Conducts research and teaches in the application of electron microscopy and micro-analysis to materials. He also organizes short courses on electron microscopy and micro-analysis. |
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| Years | Employer | Title | Department |
| Years: 1984 to 1990 | Employer: | Title: Associate Professor of Materials Science and Engineering | Department: |
Responsibilities:He did research and teaching in application of electron microscopy and micro-analysis to materials. He also organized short courses on electron microscopy and micro-analysis. |
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| Years | Employer | Title | Department |
| Years: 1980 to 1984 | Employer: E.I. duPont de Nemours and Co. | Title: Director of Electron Microscopy Lab | Department: |
Responsibilities:Conducted high spatial resolution analysis of catalysts, metals, and ceramics. |
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| Years | Employer | Title | Department |
| Years: 1976 to 1980 | Employer: Rensselaer Polytechnic Institute | Title: Assistant Professor and Director of Electron Optics Laboratory | Department: |
Responsibilities:He conducted research on metals and ceramics; trained students on the use of electron microscopy; and managed an electron optical laboratory. |
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| Years | Employer | Title | Department |
| Years: 1974 to 1976 | Employer: University of Oxford | Title: Postdoctoral Assignment | Department: |
Responsibilities:Worked on the development of analysis facilities on a custom-built field emission analytical transmission electron microscope. |
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Career Accomplishments
| Associations / Societies |
|---|
| Expert is a member of the Microscopy Society of America, Microbeam Analysis Society, ASM International, and American Chemical Society. |
| Professional Appointments |
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| He has been Editor-in-Chief, Microscopy and Microanalysis (Springer-Verlag-New York); President, Microscopy Society of America; and President, Microbeam Analysis Society. |
| Publications and Patents Summary |
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| Expert has over 100 publications, and is the co-author of two textbooks on electron microscopy and micro-analysis. |
Fields of Expertise
analytical electron microscopy, electron diffraction, X-ray emission, X-ray spectroscopy, electron probe microanalysis, electron microscope, electron microscopy, electron emission, electron optics, scanning electron microscope, scanning electron microscopy, field emission, electron gun, transmission electron microscopy, analytical transmission electron microscopy, field-emission microscope, microbeam technology, metal testing, boron analysis, cast iron analysis, iron analysis, chemical surface analysis, analytical test, analytical testing, education, analytical chemistry instrument, chemical instrument, microchemical analysis, carbon film, catalyst poisoning, nitric oxide, material impregnation, specimen, environmental scanning electron microscopy, ray, scanning, microanalysis, oxide ceramic, reduction, metal surface chemistry, materials engineering, electrooptics, imaging, stainless steel corrosion, vacuum measurement, diffraction, iron corrosion, pollution, X-ray absorption, quantitative chemical analysis, qualitative chemical analysis, gun, X-ray diffraction, X-ray fluorescence, X-ray photoelectron spectroscopy, X-ray crystallography, X-radiation, copper alloy data, cathode-ray tube, microscope, powder X-ray diffraction, measurement process, emission process, analysis technique, crystallography, microscopy, X-ray diffraction analysis, vacuum deposition, zeolite catalyst, vacuum seal, vacuum pump, ultra-high vacuum, thin film, surface chemistry, surface analysis, steel, stainless steel, rhodium, powder metallurgy material, pollution catalysis, platinum, palladium, oxide, optics, nitrous oxide, molecular sieve, alloy, metallurgy, metallography, metal chemical analysis, metal analytical chemistry, ion pump, intermetallic compound, heterogeneous catalysis, diffusion pump, crystalline structure, copper alloy property, colloid and interface chemistry, chemical analysis, catalyst, catalysis, cast iron, carbon steel, automotive catalysis, Auger electron spectroscopy, analytical chemistry, aluminum oxide, aluminum alloy, aluminum