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ON-LINE PROCESS ANALYSIS. Expert pioneered the development and use of on-line near infrared (NIR) process analysis for refinery and chemicals process monitoring at Exxon. His designs are the basis for a commercially available system and have been instrumental in products developed by several analyzer system suppliers. He has extensive in-plant experience, including analyzer installation and trouble shooting, as well as knowledge of analyzer system placement, selection, and benefits. While Expert has specialized in liquids and liquid fuels analysis, he is experienced in the measurement of solids, particulate slurries, and gas-phase systems.

REAL-TIME SPECTROSCOPIC ANALYSIS. Expert specializes in the use of spectroscopic measurements to monitor chemical reactions. Critical to these applications are the marriage of spectroscopic instrumentation and computerization. He is expert at this combination and the customization and optimization of both which are often required. He is experienced in real-time analysis of very slow reactions (days) to very fast reactions (nano-seconds).

CHEMOMETRICS (MULTIVARIATE) DATA ANALYSIS. Expert has over 25 years of experience applying computer techniques to the analysis of large, complex data sets. For the last twelve years, he has specialized in chemometrics analysis, both graphical and computational, for analysis of complex spectroscopic data and to develop robust multivariate chemical composition and property estimators for use with real-time spectroscopic analysis.

APPLIED SPECTROSCOPY. Expert has spent his entire career in the applications of spectroscopy for the determination of physical and chemical properties of complex materials and the real-time analysis of chemical reactions. A pioneer in dynamic light scattering spectroscopy for examining reactions leading to the formation of complex biochemical structures, Expert has also been active in transient spectroscopy, both laser and FT-IR. His areas of spectroscopic expertise include adsorption and reflection spectroscopy (FT-IR, NIR, UV-Vis), scattering (dynamic light scattering and small angle neutron scattering), and near infrared FT-Raman.

COMPUTERIZED DATA ACQUISITION & CONTROL. Expert has over 25 years experience with general purpose, laboratory, and plant computing. He has designed and installed some of the first systems for centralized inventory control and distribution, computer control of experiments, synchronized multi-instrument control and robust process analyzer control systems. He is an expert at open (generic) system design methods which allow system flexibility and technology upgrades in this rapidly changing hardware and software environment.